Diamond Materials Growth substrates
CVD Diamond Seed Crystals
Single-crystal starting surfaces for growing further CVD diamond.
Good to know
- The seed’s orientation and surface condition influence subsequent growth.
- Polishing damage and crystal defects should be considered when assessing the growth face.
- Seed specifications describe the starting substrate, not the quality of a future grown layer.
Specifications
What we define for CVD diamond seed crystals, with units and how each is typically measured. We confirm values for your application in technical review.
Request the datasheetLook up a term in the glossaryDimensions & tolerances
| Parameter | Unit | Typical test method |
|---|---|---|
| Lateral size, outline or diameter, and tolerance | mm | Optical measurement |
| Thickness and tolerance (bulk or layer) | mm | Micrometer or optical gauge |
| Edge condition and chip limit | Microscopy inspection to drawing | |
| Parallelism or wedge | arcmin | Autocollimator or interferometry |
Crystal & purity
| Parameter | Unit | Typical test method |
|---|---|---|
| Face orientation, edge orientation and miscut | XRD or Laue diffraction | |
| Inclusions, growth sectors and defects | Cross-polarised microscopy or birefringence imaging | |
| Crystalline quality (rocking-curve width) | arcsec | XRD rocking curve |
| Dislocation density | cm⁻² | X-ray topography or etch-pit counting |
| Growth sectors and internal strain | Cross-polarised microscopy or birefringence imaging |
Surface & finish
| Parameter | Unit | Typical test method |
|---|---|---|
| Surface finish condition (as-grown, lapped or polished) | Visual inspection to drawing | |
| Surface roughness per side | nm Ra | Profilometry or AFM |
Integration & packaging
| Parameter | Unit | Typical test method |
|---|---|---|
| Packaging, cleanliness and labelling | Per drawing | |
| Certificate of conformance and traceability | Supplier declaration |
Where it is used
Requirement to review
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